[quantum-info] Seminar IQC - Tuesday, Feb 25, 2014, at 2:00 PM
Matthew Fries
mfries at uwaterloo.ca
Mon Feb 24 10:59:03 EST 2014
Seminar
Institute for Quantum Computing
Tuesday, 25 February 2014 at 2:00PM
QNC 0101
An atom trap trace analysis (ATTA) system to measure trace contamination by Kr of XENON dark matter detector
Tae Hyun Yoon
Columbia University
In the XENON dark matter search experiment, trace contamination of Xe by Kr contributes background events through the beta decay of radioactive Kr-85. To achieve the required sensitivity of the detector, the contamination must be reduced below the part per trillion (ppt) level and this level must be known precisely. We have developed an atom trap trace analysis (ATTA) device using standard atom cooling and trapping techniques to detect Kr below the ppt level.
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